Vietnam Academy of Science and Technology

Project's information

Project's title	Study of temperature dependence of thermodynamic parameters of materials by anhamonic XAFS, application to some pure and multicomponent materials
Research hosting institution	Institute of Geological Sciences
Project’s list	Project of Viet Nam Academy of Science and Technology (VAST) for young researchers
Project leader’s name	MSc. Cu Sy Thang
Project duration	01/01/2013 - 01/01/2015
Project’s budget	300.000.000 VND
Classify	Good
Goal and objectives of the project	Study of temperature dependence of thermodynamic parameters of materials by anhamonic XAFS. Application to some pure and multicomponent materials.
Main results	*Theoretical results:* 01 paper in an international scientific journal (ISI). 01 paper in domestic scientific journal. Studying temperature dependence of the Mean Square Displacement (MSD) of some semiconductor elements such as Ga and As in GaAs; Ga and P in GaP; In and P in InP; In and Sb in InSb. Evaluating the relationship between their MSD in semiconductor compounds as a function of temperature. *Applied results:* Measurements of XAFS spectra for Cu and Zn within temperature range between 400 and 1000K. As a result, Debye-Waller factors were achieved for temperature at 300K, 400K, 500K and 600K, respectively. The result were evaluated and compared with variously reported experiments and calculated models.
Novelty and actuality and scientific meaningfulness of the results	Evaluation of the relationship between the MSD of a semiconductor element and MSD of another element in their compound as a function of temperature is a new finding. Measurements of XAFS spectra for Cu and Zn within temperature range between 400 and 1000K are newly conducted for Viet Nam.
Products of the project	Scientific papers in referred journals (list): Temperature dependence of Debye - Waller factors of semiconductors. Jounal Vacumm 101 (2014) 63-66. Temperature dependence of experiment and calculation of Debye-Waller factor of copper. Vietnam Science and Technology Review. (submitted)
Recommendations	XAFS spectroscopy method is a useful method for studying structure materials at the atomic and molecular scales. Members of the project expect The Ministry of Science and Technology and the Vietnam Academy of Science and Technology pay more attendtion to the field of XAFS spectroscopy. The project’s leader would like to continue studying on XAFS spectroscopy. Especially, the applications of XAFS spectroscopy in different fields.
Images of project